Applications and Metrology at Nanometer Scale 1 (Innbundet)

Smart Materials, Electromagnetic Waves and Uncertainties


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Forfatter: , og
Innbinding: Innbundet
Utgivelsesår: 2021
Antall sider: 256
Forlag: ISTE Ltd
Språk: Engelsk
ISBN/EAN: 9781786306401
Omtale Applications and Metrology at Nanometer Scale 1
To develop innovations in quantum engineering and nanosystems,
designers need to adopt the expertise that has been developed in
research laboratories. This requires a thorough understanding of the
experimental measurement techniques and theoretical models, based on
the principles of quantum mechanics.
This book presents experimental methods enabling the development and
characterization of materials at the nanometer scale, based on practical
engineering cases, such as 5G and the interference of polarized light
when applied for electromagnetic waves. Using the example of
electromechanical, multi-physical coupling in piezoelectric systems,
smart materials technology is discussed, with an emphasis on scale
reduction and mechanical engineering applications. Statistical analysis
methods are presented in terms of their usefulness in systems
engineering for experimentation, characterization or design, since safety
factors and the most advanced reliability calculation techniques are
included from the outset.
This book provides valuable support for teachers and researchers but is
also intended for engineering students, working engineers and Master's

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