Applications and Metrology at Nanometer-Scale 2 (Innbundet)

Measurement Systems, Quantum Engineering and RBDO Method

Forfatter:

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Forfatter: , og
Innbinding: Innbundet
Utgivelsesår: 2021
Antall sider: 288
Forlag: ISTE Ltd
Språk: Engelsk
ISBN/EAN: 9781786306876
Omtale Applications and Metrology at Nanometer-Scale 2
Nanoscience, nanotechnologies and the laws of quantum physics are
sources of disruptive innovation that open up new fields of application.
Quantum engineering enables the development of very sensitive
materials, sensor measurement systems and computers. Quantum
computing, which is based on two-level systems, makes it possible to
manufacture computers with high computational power.
This book provides essential knowledge and culminates with an industrial
application of quantum engineering and nanotechnologies. It presents
optical systems for measuring at the nanoscale, as well as quantum
physics models that describe how a two-state system interacts with its
environment. The concept of spin and its derivation from the Dirac
equation is also explored, while theoretical foundations and example
applications aid in understanding how a quantum gate works. Application
of the reliability-based design optimization (RBDO) method of mechanical
structures is implemented, in order to ensure reliability of estimates from
the measurement of mechanical properties of carbon nanotube
structures.
This book provides valuable support for teachers and researchers but is
also intended for engineering students, working engineers and Master's
students.

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