Cluster Secondary Ion Mass Spectrometry (Innbundet)

Principles and Applications

Serie: Wiley Series on Mass Spectrometry 


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Innbinding: Innbundet
Utgivelsesår: 2013
Antall sider: 368
Forlag: John Wiley and Sons Ltd
Språk: Engelsk
Serie: Wiley Series on Mass Spectrometry
ISBN/EAN: 9780470886052
Omtale: Cluster Secondary Ion Mass Spectrometry
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.

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