This handbook contains an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self-contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. Among the many valuable features included in each of these handbooks are: All spectra were measured by using Al_ka monochromatic X-rays. All spectra were collected in a self-consistent manner to maximize data reliability and quality. All peaks in the wide spectra are fully annotated and accompanies by detailed atom per cent tables that report BEs for each of the labelled peaks. Each high-energy resolution spectrum is peak-fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.